Superseded
Standard
Historical
IEC 60749-6:2002
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Preview
Summary
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
The contents of the corrigendum of August 2003 have been included in this copy.
The contents of the corrigendum of August 2003 have been included in this copy.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/12/2002 |
| Release Date | 04/12/2002 |
| Cancellation Date | 03/03/2017 |
| Edition | 1 |
| Page Count | 7 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
12/04/2002
Superseded
Historical
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