Superseded
Standard
Historical
IEC 60749-5:2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Preview
Summary
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/17/2003 |
| Release Date | 01/17/2003 |
| Cancellation Date | 04/10/2017 |
| Edition | 1 |
| Page Count | 13 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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