Superseded
Standard
Historical
IEC 60749-17:2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Preview
Summary
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 02/20/2003 |
| Release Date | 02/20/2003 |
| Cancellation Date | 03/28/2019 |
| Edition | 1 |
| Page Count | 11 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
20/02/2003
Superseded
Historical
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