Superseded
Standard
Historical
IEC 60749-12:2002
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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Summary
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/30/2002 |
| Release Date | 04/30/2002 |
| Cancellation Date | 12/13/2017 |
| Edition | 1 |
| Page Count | 7 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
30/04/2002
Superseded
Historical
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