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IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
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Summary
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
The contents of the corrigendum of August 2003 have been included in this copy.
The contents of the corrigendum of August 2003 have been included in this copy.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/30/2002 |
| Release Date | 08/30/2002 |
| Edition | 1 |
| Page Count | 15 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/08/2002
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