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IEC 60747-11:1985
Semiconductor devices. Discrete devices. Part 11: Sectional
specification for discrete devices
specification for discrete devices
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Summary
Applies to discrete semiconductor devices, excluding optoelectronic
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1985 |
| Release Date | 01/01/1985 |
| Cancellation Date | 12/31/2015 |
| Edition | 1 |
| Page Count | 35 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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01/01/1985
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