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IEC 60512-26-100:2008+AMD1:2011 Consolidated
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
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Summary
IEC 60512-26-100:2008+A1:2011 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided:
- insertion loss, test 26a;
- return loss, test 26b;
- near-end crosstalk (NEXT), test 26c;
- far-end crosstalk (FEXT), test 26d;
- transfer impedance, test 26e;
- transverse conversion loss (TCL), test 26f;
- transverse conversion transfer loss (TCTL), test 26g.
This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006.
This consolidated version consists of the first edition (2008) and its amendment 1 (2011).
- insertion loss, test 26a;
- return loss, test 26b;
- near-end crosstalk (NEXT), test 26c;
- far-end crosstalk (FEXT), test 26d;
- transfer impedance, test 26e;
- transverse conversion loss (TCL), test 26f;
- transverse conversion transfer loss (TCTL), test 26g.
This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006.
This consolidated version consists of the first edition (2008) and its amendment 1 (2011).
Notes
Combine CEI 60512-26-100 (2008-07) et AMD 1 (2011-03)
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/25/2011 |
| Release Date | 05/25/2011 |
| Edition | 1.1 |
| Page Count | 117 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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