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IEC 60512-25-6:2004
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
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Summary
Describes methods for measuring an eye pattern response and jitter in the time domain.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/26/2004 |
| Release Date | 05/26/2004 |
| Edition | 1 |
| Page Count | 35 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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