IEC 60444-6:1995
Superseded Standard
Historical

IEC 60444-6:1995

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Most recent standard

Summary

Applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods are described.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 03/01/1995
Release Date 03/01/1995
Cancellation Date 06/19/2013
Edition 1
Page Count 35
EAN ---
ISBN ---
Weight (in grams) ---
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