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Standard
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IEC 60410:1973
Sampling plans and procedures for inspection by attributes
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Summary
Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1973 |
| Release Date | 01/01/1973 |
| Cancellation Date | 10/30/2015 |
| Edition | 1 |
| Page Count | 82 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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01/01/1973
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