Withdrawn
Standard
Most Recent
IEC 60333:1993
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Summary
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 07/14/1993 |
| Release Date | 07/14/1993 |
| Cancellation Date | 07/15/2010 |
| Edition | 3 |
| Page Count | 76 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
01/01/1970
Superseded
Historical
01/01/1983
Superseded
Historical
14/07/1993
Withdrawn
Most Recent
No products.