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IEC 60333:1993

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

Summary

Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 07/14/1993
Release Date 07/14/1993
Cancellation Date 07/15/2010
Edition 3
Page Count 76
EAN ---
ISBN ---
Weight (in grams) ---
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