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IEC 60147-3:1970
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 3: Reference methods of measurement
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Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1970 |
| Release Date | 01/01/1970 |
| Cancellation Date | 03/31/1995 |
| Edition | 1 |
| Page Count | 29 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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