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IEC 60147-2M:1980
Supplement M - Essential ratings and characteristics of
semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
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Summary
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1980 |
| Release Date | 01/01/1980 |
| Cancellation Date | 03/31/1995 |
| Edition | 1 |
| Page Count | 73 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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