Superseded
Standard
Historical
IEC 60147-2E:1973
Supplement E - Essential ratings and characteristics of
semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
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Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1973 |
| Release Date | 01/01/1973 |
| Cancellation Date | 01/01/1983 |
| Edition | 1 |
| Page Count | 65 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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