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IEC 60147-2:1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
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Summary
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1963 |
| Release Date | 01/01/1963 |
| Cancellation Date | 03/31/1995 |
| Edition | 1 |
| Page Count | 55 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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