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IEC 60147-0F:1982
Supplement F - Essential ratings and characteristics et
semiconductor devices and general principles of measuring methods -
Part 0: General and terminology
semiconductor devices and general principles of measuring methods -
Part 0: General and terminology
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Summary
Applies to the storage, transport, handling and testing of electrostatic sensitive devices: the discharge of electrostatic energy from unearthed equipment or operators produces voltages that could destroy the device, even if the device contains protection circuits.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1982 |
| Release Date | 01/01/1982 |
| Cancellation Date | 03/31/1995 |
| Edition | 1 |
| Page Count | 45 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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