Withdrawn
Standard
Most Recent
IEC 60147-0:1966
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
Preview
Summary
Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1966 |
| Release Date | 01/01/1966 |
| Cancellation Date | 03/31/1995 |
| Edition | 1 |
| Page Count | 57 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
No products.