Superseded Standard
Historical

IEC 60060-3:1976

High-voltage test techniques - Part 3: Measuring devices

Summary

Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 01/01/1976
Release Date 01/01/1976
Cancellation Date 11/23/1994
Edition 1
Page Count 21
EAN ---
ISBN ---
Weight (in grams) ---
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