DIN SPEC 52407:2015-03
Active Standard
Most Recent

DIN SPEC 52407:2015-03

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Summary

Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 03/01/2015
Page Count 23
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

No products.
Contact us