Superseded
Draft standard
Historical
DIN IEC 60749-26:2011-09
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge sensitivity testing - Human body model (HBM) - Component Level (IEC 47/2101A/CDV:2011)
Preview
Summary
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 26: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Human Body Model (HBM) - Bauelementeniveau (IEC 47/2101A/CDV:2011)
Notes
Prévu pour remplacer DIN EN 60749-26 (2007-01).
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2011 |
| Cancellation Date | 09/01/2014 |
| Page Count | 62 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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