Superseded
Draft standard
Historical
DIN 50990:2018-03
Measurement of coating thickness - Measurement of the area-related mass of metallic layers by means of spectrometric measurement methods
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Summary
Messung von Schichtendicken - Messung der flächenbezogenen Masse von metallischen Schichten mittels spektrometrischer Messverfahren
Notes
Prévu pour remplacer DIN 50988-2 (1988-04), DIN 50990 (1993-11).
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 03/01/2018 |
| Cancellation Date | 12/01/2018 |
| Page Count | 13 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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