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BS IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical Part 52: Biaxial tensile testing method for stretchable MEMS
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/10/2026 |
| Page Count | 18 |
| Themes | Tensile testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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