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BS IEC 60747-5-18:2026
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the macro photoluminescence for epitaxial wafers micro light diodes
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/16/2026 |
| Page Count | 22 |
| Themes | Epitaxial layers |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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