Superseded
Standard
Historical
ASTM E766-98
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Summary
1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and magnification indicated on the SEM readout may be different at different magnifications, this practice must be applied to each magnification for which true magnification is desired.
1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 12/10/1998 |
| Collection | |
| Page Count | 6 |
| Themes | Optical equipment |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
10/12/1998
Superseded
Historical
10/12/1998
Superseded
, Reaffirmed
Historical
10/12/1998
Superseded
, Reaffirmed
Historical
01/01/2014
Superseded
Historical
ASTM E766-14e1
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
01/01/2014
Superseded
Historical
01/01/2014
Active
, Reaffirmed
Most Recent
Collections list
01/07/2025
Active
Most Recent
01/07/2026
Forthcoming
Most Recent