26/30493764 DC:2026
Active Draft standard
Most Recent

26/30493764 DC:2026

BS ISO 16887 Microbeam analysis. Analytical electron microscopy. Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system
No description.

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 03/02/2026
Page Count 32
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

No products.
Contact us