Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
€404.00
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
€269.00
Bio-based products. content Determination of the bio-based using material balance method
€193.00
Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
Surface chemical analysis. Guidelines to sample handling, preparation and mounting Reporting information related the history, preparation, handling of nano-objects prior surface analysis
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
Gas analysis. General quality aspects and metrological traceability of calibration gas mixtures
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Gas analysis. Sampling guidelines
€374.00
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
€316.00
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Critical flow orifices
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy. Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
