71.040.40 : Chemical analysis

ASTM D5902-05(2019)

ASTM D5902-05(2019)

Superseded Historical

Standard Test Method for Rubber—Determination of Residual Unsaturation in Hydrogenated Nitrile Rubber (HNBR) by Iodine Value

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ASTM D5074-90(2019)e1

ASTM D5074-90(2019)e1

Superseded Historical

Standard Practice for Preparation of Natural-Matrix Sediment Reference Samples for Major and Trace Inorganic Constituents Analysis by Partial Extraction Procedures

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ASTM D7959-19

ASTM D7959-19

Superseded Historical

Standard Test Method for Chloride Content Determination of Aviation Turbine Fuels using Chloride Test Strip

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BS ISO 17560:2014

BS ISO 17560:2014

Active Most Recent

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon

€193.00

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BS ISO 18337:2015

BS ISO 18337:2015

Active Most Recent

Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope

€193.00

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BS ISO 14606:2015

BS ISO 14606:2015

Superseded Historical

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

€269.00

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BS ISO 18554:2016

BS ISO 18554:2016

Active Most Recent

Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy

€269.00

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BS ISO 14706:2014

BS ISO 14706:2014

Active Most Recent

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

€316.00

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BS ISO 18115-1:2013

BS ISO 18115-1:2013

Superseded Historical

Surface chemical analysis. Vocabulary General terms and used in spectroscopy

€404.00

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BS ISO 18115-2:2013

BS ISO 18115-2:2013

Superseded Historical

Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy

€374.00

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BS ISO 14707:2015

BS ISO 14707:2015

Superseded Historical

Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use

€269.00

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BS ISO 19830:2015

BS ISO 19830:2015

Active Most Recent

Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

€316.00

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BS ISO 16962:2017

BS ISO 16962:2017

Active Most Recent

Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry

€374.00

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BS EN 16785-1:2015

BS EN 16785-1:2015

Active Most Recent

Bio-based products. content Determination of the bio-based using radiocarbon analysis and elemental

€269.00

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BS ISO 18118:2015

BS ISO 18118:2015

Superseded Historical

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

€316.00

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