Semiconductor devices - Micro-electromechanical devices - Part 10: Micropillar compression test for MEMS materials (IEC 47F/48/CD:2010)
€69.91
Semiconductor devices - Micro electro mechanical devices - Part 13: Bend- and shear- test methods of measuring adhesive strength for MEMS structures (IEC 47F/44/CD:2010)
Fibre optic connector optical interfaces Optical interface, 2,5 mm and 1,25 diameter cylindrical full zirconia PC ferrule, single mode fibre
€193.00
Connectors for electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
€22.00
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS FBAR Filter & Duplexer (IEC 47/1969/CD:2008)
€111.40
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 47/1947/CD:2007)
€98.32
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS Switches (IEC 47/1928/CD:2007)
€116.64
Optical fibres Measurement methods and test procedures. Polarization mode dispersion
€374.00
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)
€91.03
Connectors for electronic equipment - Tests and measurements -- Part 1-100: General - Applicable publications (IEC 60512-1-100:2006)
€56.00
International Electrotechnical Vocabulary - Part 581: Electromechanical components for electronic equipment (IEC 1/1982/CDV:2006)
€185.05
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2005); German version EN 62047-1:2006.
€105.42
Optical fibres Measurement methods and test procedures Differential mode delay
€269.00
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 47/1857/CD:2006)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods -- Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories.
€0.00
