Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 3 : encombrements normalisés et connexions des sorties
€126.00
Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections
€316.00
Piezoelectric filters Standard outlines and lead connections
€193.00
Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
Generic specification - Filters using waveguide type dielectric resonators; German version EN 171000:2001.
€105.42
Test fixture for surface mounted quartz crystal units (IEC 49/529/CD:2001)
€48.79
Glossary for piezoelectric and dielectric devices for frequency control and selection - Part 4-2: Piezoelectric materials; Ceramics (IEC 49/528/CD:2001)
Test-fixture of surface mounting quartz crystal units
Résonateurs à quartz sous assurance de la qualité - Partie 3 : encombrements normalisés et connexions des sorties
Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
€22.00
Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 49/503/CDV:2001); German version prEN 60122-1:2001
€128.22
Harmonized system of quality assessment for electronic components. Generic specification. Filters using waveguide type dielectric resonators
€269.00
Amendment 2 to IEC 60679-1: Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (phase jitter and wander of quartz crystal controlled oscillators) (IEC 49/498/CD:2001)
Definition and measurement of activity dips of crystal units (IEC 49/497/CD:2001)
Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
€286.00
