Standard data element types with associated classification scheme Definitions. Principles and methods
€404.00
Process management for avionics. Atmospheric radiation effects Guidelines single event testing avionics systems
€355.00
Standard data element types with associated classification scheme for electric components - Part 6: IEC Common Data Dictionary (IEC CDD) quality guidelines (IEC 61360-6:2016); German version EN 61360-6:2017
€140.00
IEC 62396-2:2017 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
€325.00
Standard data element types with associated classification scheme - Part 1 : definitions - Principles and methods - Types normalisés d'éléments de données avec plan de classification pour composants électriques - Partie 1 : Définitions - Principes et méthodes
€286.67
Collection, logistics & treatment requirements for WEEE - Part 2-4 : treatment requirements for photovoltaic panels
€111.67
Packaging of components for automatic handling - Part 1 : tape packaging of components with axial leads on continuous tapes
€95.67
Enregistrement d'ontologie de produits normalisés et transfert par tableurs - Partie 5 : interface pour la description des activités
€198.33
Spécification générique relative aux informations sur les produits données par les propriétés - Partie 1 : principes et méthodes
€138.00
Process management for avionics. Atmospheric radiation effects Management of single event (SEE) analysis process in avionics design
€193.00
Process management for avionics. Atmospheric radiation effects Extreme space weather. Potential impact on the avionics environment and electronics
Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 114: Electrochemistry
€11.00
Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
€22.00
Electronic components. Long-term storage of electronic semiconductor devices General
€316.00
Electric components. Reliability. Reference conditions for failure rates and stress models for conversion
