SASB/SCC20 : SCC20 - Test and Diagnosis for Electronic Systems

IEEE/IEC 62529:2007

IEEE/IEC 62529:2007

Superseded Historical

IEC 62529 Ed. 1 Standard for Signal and Test Definition

€408.00

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IEEE 1641:2004

IEEE 1641:2004

Superseded Historical

IEEE Standard for Signal and Test Definition

€419.00

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IEEE 1522:2004

IEEE 1522:2004

Withdrawn Most Recent

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

€85.00

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IEEE 488.1:2003 (R2009)

IEEE 488.1:2003 (R2009)

Withdrawn Most Recent

IEEE Standard For Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation

€381.00

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IEEE/IEC 62243:2002

IEEE/IEC 62243:2002

Superseded Historical

IEC/IEEE International Standard - Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)

€320.00

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IEEE 1232:2002

IEEE 1232:2002

Superseded Historical

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)

€320.00

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IEEE 1546:2000 (R2011)

IEEE 1546:2000 (R2011)

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IEEE Guide for Digital Test Interchange Format (DTIF) Application

€123.00

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IEEE 1174:2000 (R2009)

IEEE 1174:2000 (R2009)

Withdrawn Most Recent

IEEE Standard Serial Interface for Programmable Instrumentation

€126.00

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IEEE 1545:1999

IEEE 1545:1999

Withdrawn Most Recent

IEEE Standard for Parametric Data Log Format

€138.00

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IEEE 1226:1998

IEEE 1226:1998

Withdrawn Most Recent

IEEE Standard for a Broad-Based Environment for Test (ABBET(TM)), Overview and Architecture

€123.00

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IEEE 1445:1998 (R2009)

IEEE 1445:1998 (R2009)

Superseded Historical

IEEE Standard for Digital Test Interchange Format (DTIF)

€126.00

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IEEE 1232.2:1998

IEEE 1232.2:1998

Superseded Historical

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Service Specification

€173.00

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IEEE 1232.1:1997

IEEE 1232.1:1997

Superseded Historical

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification

€155.00

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IEEE 993:1997

IEEE 993:1997

Withdrawn Most Recent

IEEE Standard for Test Equipment Description Language (TEDL)

€146.00

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IEEE 1226.6:1996

IEEE 1226.6:1996

Withdrawn Most Recent

IEEE ABBET(R)- IEEE Guide for the Understanding of the "A Broad-Based Environment for Test (ABBET)(R)" Standard

€54.00

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