SASB/SCC20 : SCC20 - Test and Diagnosis for Electronic Systems

IEEE 1636.1:2013

IEEE 1636.1:2013

Superseded Historical

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

€135.00

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IEEE 1505.1:2008

IEEE 1505.1:2008

Superseded Historical

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

€169.00

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IEEE 1636.2:2010

IEEE 1636.2:2010

Superseded Historical

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

€128.00

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IEEE 1671.6:2008

IEEE 1671.6:2008

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

€68.00

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IEEE 1671.5:2008

IEEE 1671.5:2008

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

€68.00

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IEEE 1232:2010

IEEE 1232:2010

Withdrawn Most Recent

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

€295.00

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IEEE 1671:2010

IEEE 1671:2010

Withdrawn Most Recent

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

€431.00

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IEEE 1505:2010

IEEE 1505:2010

Withdrawn Most Recent

IEEE Standard for Receiver Fixture Interface

€148.00

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IEEE 1641:2010

IEEE 1641:2010

Withdrawn Most Recent

IEEE Standard for Signal and Test Definition

€454.00

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IEEE 1671.1:2009

IEEE 1671.1:2009

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

€175.00

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IEEE 1636:2009

IEEE 1636:2009

Superseded Historical

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€78.00

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IEEE 1671.2:2008

IEEE 1671.2:2008

Superseded Historical

IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions

€124.00

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IEEE 1671.4:2007

IEEE 1671.4:2007

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

€107.00

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IEEE 1671.3:2007

IEEE 1671.3:2007

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

€94.00

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IEEE 1636.1:2007

IEEE 1636.1:2007

Superseded Historical

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)

€138.00

View more