BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor
€23.00
BS EN IEC 62228-7 Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
BS IEC 62807-2 Hybrid telecommunication cables Part 2: Indoor hybrid - Sectional specification
BS IEC 63145-30 ED1 Eyewear display Part 30: Durability test methods
Standard for Signal and Test Definition
€404.00
Radio-frequency connectors Sectional specification for RF coaxial with push on mating. Characteristic impedance 50 O (type SMP3)
€316.00
BS EN IEC 61935-2/AMD1 Amendment 1 - Specification for the testing of balanced and coaxial information technology cabling Part 2: Cords as specified in ISO/IEC 11801-1 related standards
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic Part 1: Evaluation method of basic characteristics in memristor
BS EN IEC 63550-2 Semiconductor devices - Neuromorphic Part 2: Evaluation method of linearity in memristor
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength microstructures
€193.00
Environmental testing Supporting documentation and guidance. Confirmation of the performance whisker test method
€374.00
Soft soldering fluxes. Test methods Cleanliness of soldered printed circuit assemblies before and/or after cleaning
BS EN IEC 63516 Fixed folding durability test method for flexible opto-electric circuit boards
Intelligent transport systems. Public-area mobile robots (PMR) Overview of paradigm
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification
