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IEC TS 62876-2-1:2018
IEC TS 62876-2-1:2018 Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
Summary
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/29/2018 |
| Edition | 1.0 |
| Page Count | 30 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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