IEC TS 62607-5-3:2020
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IEC TS 62607-5-3:2020

IEC TS 62607-5-3:2020 Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

Summary

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 04/14/2020
Edition 1.0
Page Count 20
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Weight (in grams) ---
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