Superseded
Standard
Historical
IEC TS 62396-5:2008
IEC TS 62396-5:2008 Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
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Summary
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/19/2008 |
| Cancellation Date | 08/01/2014 |
| Edition | 1.0 |
| Page Count | 18 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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