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IEC TR 62433-4-1:2025
IEC TR 62433-4-1:2025 EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
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Summary
IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB.
This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.
This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/26/2025 |
| Edition | 1.0 |
| Page Count | 40 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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