IEC 62899-402-1:2017
Superseded Standard
Historical

IEC 62899-402-1:2017

IEC 62899-402-1:2017 Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

Summary

IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 03/03/2017
Edition 1.0
Page Count 12
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ISBN ---
Weight (in grams) ---
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