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IEC 62526:2007
IEC 62526:2007 Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
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Summary
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/07/2007 |
| Edition | 1.0 |
| Page Count | 123 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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