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IEC 61445:2012
IEC 61445:2012 Digital Test Interchange Format (DTIF)
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Summary
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 06/21/2012 |
| Edition | 1.0 |
| Page Count | 101 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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