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26/30564451 DC:2026
BS EN IEC 63740 Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs (Fast Track)
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/17/2026 |
| Page Count | 29 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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01/04/1996
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08/08/2024
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