Advanced technical ceramics. Methods of test for ceramic powders Determination densification on natural sintering
€165.00
Advanced technical ceramics. Mechanical properties of ceramic composites at ambient temperature. Evaluation of the resistance to crack propagation by notch sensitivity testing
€193.00
Advanced technical ceramics. Mechanical properties of ceramic composites at high temperature under inert atmosphere. Determination of creep behaviour
Advanced technical ceramics. Ceramic composites. Determination of elastic properties by resonant beam method up to 2000°C
€269.00
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials by test chamber under indoor lighting environment Removal formaldehyde
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for spherical indentation of porous ceramics
Fine ceramics (advanced ceramics, advanced technical ceramics). Vocabulary
€316.00
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for interfacial bond strength of ceramic materials at elevated temperatures
Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of elastic modulus of ceramics at high temperature by thin wall C-ring method
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for flexural bond strength of ceramics
Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement of iso-electric point of ceramic powder
Fine ceramics (advanced ceramics, advanced technical ceramics). Mechanical properties of ceramic composites at room temperature. Determination of compressive properties
BS EN 1748-2-2. Glass in building. Special basic products. Glass ceramics. Part 2-2. Product standard
€23.00
BS EN 1748-2-1. Glass in Building. Special basic products. Glass ceramics. Part 2-1. Definitions and general physical and mechanical properties
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
