Standard Test Method for Determination of Carbon in Refractory and Reactive Metals and Their Alloys by Combustion Analysis
€58.00
Mechanical solid-liquid separation by cake filtration - Determination of filter cake resistance.
€95.21
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
€269.00
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of arsenic in silicon
€115.00
Standard Guide for Laboratory Requirements Necessary to Test Commercial Cooking and Warming Appliances to ASTM Test Methods
€65.00
Standard Test Method for Determining Elements in Waste Streams by Inductively Coupled Plasma-Atomic Emission Spectroscopy
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Gas analysis - Measurement programs and data evaluation procedures for gas chromatography and other comparison methods; only on CD-ROM
€162.06
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials - Analyse chimique des surfaces
€82.01
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Fume cupboards - Part 5 : recommendations for installation and maintenance
€181.20
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials
€155.00
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy Amendment 1
€21.00
Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 1: General requirements
€523.00
Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS
