Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
€77.00
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
€316.00
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
€155.00
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Gas analysis — Preparation of calibration gas mixtures using dynamic methods Part 2: Piston pumps
€183.00
Standard Practice for Mounting Actinides for Alpha Spectrometry Using Neodymium Fluoride
€58.00
Terms and definitions used in connection with reference materials.
€20.00
Standard Practices for Verification and Calibration of Polarimeters
Standard Practice for Estimating Uncertainty of Test Results Derived from Spectrophotometry
€65.00
Alcohol interlocks - Test methods and performance requirements - Part 2 : instruments having a mouthpiece and measuring breath alcohol for general preventive use - Éthylotests anti-démarrage
€38.98
Gas analysis - Absolute volumetric method for dynamic preparation of calibration gases - Part 1: Preparation from pure gases, with CD-ROM.
€134.02
Microbeam analysis. Scanning electron microscopy. Vocabulary
€269.00
Expression des performances des analyseurs de gaz - Partie 7 : analyseurs de gaz laser à semiconducteurs accordables
€93.91
