Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
€193.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
€269.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Thermal mass-flow controllers
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Methods
€316.00
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Critical orifices
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Surface chemical analysis. Vocabulary General terms and used in spectroscopy
€404.00
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
€374.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Capillary devices
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Volumetric pumps
