Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
€165.00
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
€193.00
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Expression of performance electrochemical analyzers Electrolytic conductivity
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
€269.00
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Expression of performance electrochemical analyzers pH value
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
€404.00
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Capillary devices
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
€316.00
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
