71.040.40 : Chemical analysis

ISO 14976:1998 (R2022)

ISO 14976:1998 (R2022)

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Surface chemical analysis — Data transfer format

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ISO 14975:2000 (R2022)

ISO 14975:2000 (R2022)

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Surface chemical analysis — Information formats

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ISO 6143:2001 (R2017)

ISO 6143:2001 (R2017)

Superseded Historical

Gas analysis — Comparison methods for determining and checking the composition of calibration gas mixtures

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ISO 6144:2003 (R2024)

ISO 6144:2003 (R2024)

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Gas analysis — Preparation of calibration gas mixtures — Static volumetric method

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ISO 14912:2003 (R2021)

ISO 14912:2003 (R2021)

Superseded Historical

Gas analysis — Conversion of gas mixture composition data

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ISO 6145-10:2002 (R2025)

ISO 6145-10:2002 (R2025)

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Gas analysis — Preparation of calibration gas mixtures using dynamic volumetric methods Part 10: Permeation method

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UNE-EN ISO 2613-2:2024

UNE-EN ISO 2613-2:2024

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Analysis of natural gas - Silicon content of biomethane - Part 2: Determination of siloxane content by gas chromatography with ion mobility spectrometry (ISO 2613-2:2023)

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UNE-EN ISO 2612:2024

UNE-EN ISO 2612:2024

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Analysis of natural gas - Biomethane - Determination of ammonia content by Tuneable Diode Laser Absorption Spectroscopy (ISO 2612:2023)

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ISO 78-2:1999 (R2021)

ISO 78-2:1999 (R2021)

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Chemistry — Layouts for standards Part 2: Methods of chemical analysis

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ISO 16666:2025

ISO 16666:2025

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Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements

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NBN EN 16785-1:2016

NBN EN 16785-1:2016

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Bio-based products - Bio-based content - Part 1: Determination of the bio-based content using the radiocarbon analysis and elemental analysis

€121.00

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ISO 15472:2010 (R2020)

ISO 15472:2010 (R2020)

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Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales

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ISO 16413:2013

ISO 16413:2013

Superseded Historical

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

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ISO 16531:2013

ISO 16531:2013

Superseded Historical

Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

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NBN EN ISO 21079-1:2008

NBN EN ISO 21079-1:2008

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Chemical analysis of refractories containing alumina, zirconia and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents and dissolution (ISO 21079-1:2008)

€92.00

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