31.260 : Optoelectronics. Laser equipment

BS EN 60825-12:2004

BS EN 60825-12:2004

Superseded Historical

Safety of laser products free space optical communication systems used for transmission information

€316.00

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BS EN 60747-5-2:2001

BS EN 60747-5-2:2001

Active Most Recent

Discrete semiconductor devices and integrated circuits. Optoelectronic Essential ratings characteristics

€316.00

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BS EN 60747-5-3:2001

BS EN 60747-5-3:2001

Active Most Recent

Discrete semiconductor devices and integrated circuits. Optoelectronic Measuring methods

€355.00

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PD ISO/TR 11146-3:2004

PD ISO/TR 11146-3:2004

Active Most Recent

Lasers and laser-related equipment. Test methods for laser beam widths, divergence angles propagation ratios Intrinsic geometrical classification, details of test

€269.00

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BS EN 61988-4:2007

BS EN 61988-4:2007

Active Most Recent

Plasma display panels Climatic and mechanical testing methods

€269.00

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BS EN 61920:2004

BS EN 61920:2004

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Infrared free air applications

€269.00

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BS EN 61040:1993

BS EN 61040:1993

Active Most Recent

Specification for power and energy measuring detectors, instruments and equipment for laser radiation

€193.00

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BS EN 61727:1996

BS EN 61727:1996

Withdrawn Most Recent

Photovoltaic (PV) systems. Characteristics of the utility interface

€193.00

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BS EN 61194:1996

BS EN 61194:1996

Withdrawn Most Recent

Characteristic parameters of stand-alone photovoltaic (PV) systems

€193.00

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BS EN 61751:1998

BS EN 61751:1998

Active Most Recent

Laser modules used for telecommunication. Reliability assessment

€316.00

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BS EN 60068-2-77:1999

BS EN 60068-2-77:1999

Active Most Recent

Environmental testing. Test methods Body strength and impact shock

€193.00

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BS CECC 20000:1983

BS CECC 20000:1983

Active Most Recent

Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

€404.00

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BS EN 120005:1993

BS EN 120005:1993

Active Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications)

€193.00

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BS EN 120002:1993

BS EN 120002:1993

Active Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays

€193.00

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ASTM F448M-94

ASTM F448M-94

Withdrawn Most Recent

Test Method for Measuring Steady-State Primary Photocurrent [Metric] (Withdrawn 1999)

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