31.260 : Optoelectronics. Laser equipment

BS EN ISO 17526:2003

BS EN ISO 17526:2003

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Optics and optical instruments. Lasers and laser-related equipment. Lifetime of lasers

€269.00

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NBN EN ISO 17526:2003

NBN EN ISO 17526:2003

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Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)

€58.00

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ISO 17526:2003 (R2025)

ISO 17526:2003 (R2025)

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Optics and optical instruments — Lasers and laser-related equipment — Lifetime of lasers

€77.00

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NBN EN ISO 11670:2003

NBN EN ISO 11670:2003

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Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability (ISO 11670:2003)

€92.00

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ISO 11670:2003 (R2020)

ISO 11670:2003 (R2020)

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Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stability

€115.00

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BS 6493-1.5:1992

BS 6493-1.5:1992

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Semiconductor devices. Discrete devices Recommendations for optoelectronic Section 5:

€404.00

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BS EN ISO 15616-3:2003

BS EN ISO 15616-3:2003

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Acceptance tests for CO2- laser beam machines high quality welding and cutting Calibration of instruments measurement gas flow pressure

€165.00

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BS EN ISO 15616-2:2003

BS EN ISO 15616-2:2003

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Acceptance tests for CO2- laser beam machines high quality welding and cutting Measurement of static dynamic accuracy

€193.00

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BS EN ISO 15616-1:2003

BS EN ISO 15616-1:2003

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Acceptance tests for CO2- laser beam machines high quality welding and cutting General principles, acceptance conditions

€193.00

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NF EN 60747-5-2/A1, C96-005-2/A1 (02/2003)

NF EN 60747-5-2/A1, C96-005-2/A1 (02/2003)

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Discrete semiconductor devices and integrated circuits - Partie 5-2 : optoelectronic devices - Essential ratings and characteristics

€65.33

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BS EN 60747-5-3:2001

BS EN 60747-5-3:2001

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Discrete semiconductor devices and integrated circuits. Optoelectronic Measuring methods

€355.00

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BS EN 60747-5-2:2001

BS EN 60747-5-2:2001

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Discrete semiconductor devices and integrated circuits. Optoelectronic Essential ratings characteristics

€316.00

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NF EN 60747-5-3/A1, C96-005-3/A1 (12/2002)

NF EN 60747-5-3/A1, C96-005-3/A1 (12/2002)

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Discrete semiconductor devices and integrated circuits - Partie 5-3 : optoelectronic devices - Measuring methods

€52.00

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NF EN 60747-5-1/A2, C96-005-1/A2 (12/2002)

NF EN 60747-5-1/A2, C96-005-1/A2 (12/2002)

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Discrete semiconductor devices and integrated circuits - Partie 5-1 : optoelectronic devices - General

€59.33

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DIN IEC 62088:2002-09

DIN IEC 62088:2002-09

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Nuclear instrumentation - Photodiodes for scintillation detectors - Test procedures (IEC 62088:2001)

€84.58

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