Composants électroniques - Système CENELEC d'assurance de la qualité - Dispositifs de visualisation à cristaux liquides - LCD monochromes sans circuit électronique - Spécification particulière cadre.
€53.50
Sécurité du rayonnement des appareils à laser, classification des matériels, prescriptions et guide de l'utilisateur - (Complété par le CORRIGENDUM D'AOUT 1990)
€170.50
Additif 1 à la publication UTE C 96-550 d'avril 1979
€138.00
Optics and photonics - Lasers and laser-related equipment - Test methods for the spectral characteristics of lasers (ISO/FDIS 13695:2024); German and English version prEN ISO 13695:2024
€111.40
Lasers and laser-related equipment - Determination of laser resistance of tracheal tubes - Part 1: Tracheal tube shaft (ISO 11990-1:2011)
€62.00
Screens for laser working places; safety requirements and testing
€56.17
Optics and optical instruments; lasers and laser related equipment; safety of machines using laser radiation to process materials; requirements on hazards generated by laser radiation (ISO/DIS 11553:1993); German version prEN 31553:1993
Optics and optical instruments; lasers and laser related equipment; standard optical components; part 1: components for the UV, visible and near-infrared spectral range (ISO/DIS 11151-1:1993); German version prEN 31151-1:1993
Optoelectronic semiconductor devices; essential ratings and characteristics of laser diode modules for pumping an optical fibre amplifier (IEC 47C(Secretariat)25:1993)
€41.78
Optoelectronic semiconductor devices; blank detail specification for optocouplers with output transistor (IEC 47C(Secretariat)26:1993)
€63.27
Semiconductor devices; extension of IEC 60749 on optoelectronic semiconductor devices and LCD; identical with IEC 47(Secretariat)1276
€34.30
Graphical symbols for diagrams; amendment to IEC 60617-5: optical coupling device with slot for light barrier; identical with IEC 3A(Central Office)223:1992
Optoelectronic semiconductor devices; light-emitting diodes, infrared-emitting diodes and laser diodes; measuring method for small-signal cut-off frequency; identical with IEC 47(Central Office)1083
Semiconductor devices; additional measuring method for LED, IRED and laser diodes; identical with IEC 47(Central Office)1088
Semiconductor devices; sectional specification for optoelectronic devices; identical with IEC 47(Central Office)1090
